Model scratches of the size found in hard disk drives are produced under controlled conditions at a series of applied loads on both longitudinal magnetic recording (LMR) media and perpendicular magnetic recording (PMR) media using a diamond tip. The scratches are created at low speed, eliminating thermal considerations from the interpretation of the media response. Nanoindentations are produced as well. The scratches and indentations are characterized by atomic force microscope (AFM), magnetic force microscope (MFM), and also by the same magnetic reader and writer used in an integrated hard disk drive (HDD). A comparison of the response of PMR and LMR media shows the PMR media to have larger scratches and greater magnetic signal degradation than LMR media for a given scratch load. The extent of magnetic damage, as measured by MFM, is greater than the extent of surface mechanical damage, as measured by AFM. Analysis of scratches using the HDD reveals that the magnetic damage is irreversible and permanent damage in magnetic layer, which is confirmed by cross section transmission electron microscope image. The experiments reveal the mechanism for magnetic scratch erasure in the absence of thermal effects. This understanding is expected to lead to improved designs for mechanical scratch robustness of next-generation PMR media.
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January 2009
Research Papers
Stress Induced Permanent Magnetic Signal Degradation of Perpendicular Magnetic Recording System
Sung-Chang Lee,
e-mail: sungc.lee@samsung.com
Sung-Chang Lee
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
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Soo-Youl Hong,
Soo-Youl Hong
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
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Na-Young Kim,
Na-Young Kim
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
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Joerg Ferber,
Joerg Ferber
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
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Xiadong Che,
Xiadong Che
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
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Brian D. Strom
Brian D. Strom
Apple Inc.
, 1 Infinite Loop, MS5-Q Cupertino, CA 95014
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Sung-Chang Lee
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134e-mail: sungc.lee@samsung.com
Soo-Youl Hong
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
Na-Young Kim
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
Joerg Ferber
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
Xiadong Che
Samsung Information Systems America
, 75 W. Plumeria Drive, San Jose, CA 95134
Brian D. Strom
Apple Inc.
, 1 Infinite Loop, MS5-Q Cupertino, CA 95014J. Tribol. Jan 2009, 131(1): 011904 (6 pages)
Published Online: December 3, 2008
Article history
Received:
March 5, 2008
Revised:
August 5, 2008
Published:
December 3, 2008
Citation
Lee, S., Hong, S., Kim, N., Ferber, J., Che, X., and Strom, B. D. (December 3, 2008). "Stress Induced Permanent Magnetic Signal Degradation of Perpendicular Magnetic Recording System." ASME. J. Tribol. January 2009; 131(1): 011904. https://doi.org/10.1115/1.2991123
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