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Proceedings Papers

Impacts of Nanoscale Features on Infrared Radiative Properties of Metallic Slit Arrays

Y.-B. Chen, J.-S. Chen, P.-F. Hsu
Proc. ASME. MNHMT2009, ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Volume 2, 321-330, December 18–21, 2009
Publisher: American Society of Mechanical Engineers
Paper No: MNHMT2009-18053
https://doi.org/10.1115/MNHMT2009-18053
View Paper titled, Impacts of Nanoscale Features on Infrared Radiative Properties of Metallic Slit Arrays
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Topics: Nanoscale phenomena, Resonance, Cavities, Wavelength, Waves, Density, Electromagnetic fields, Excitation, Geometry, Metals
Proceedings Papers

A Cryptographic System Utilizing the Reflectance From Periodic Nanostructures

Y.-B. Chen, J.-S. Chen, P.-f. Hsu
Proc. ASME. MNHMT2009, ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Volume 2, 337-341, December 18–21, 2009
Publisher: American Society of Mechanical Engineers
Paper No: MNHMT2009-18145
https://doi.org/10.1115/MNHMT2009-18145
View Paper titled, A Cryptographic System Utilizing the Reflectance From Periodic Nanostructures
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Topics: Encryption, Nanostructures , Reflectance, Security
Proceedings Papers

Impact of Nanoscale Features of Metallic Slits on Mid-Infrared Radiative Properties

Y.-B. Chen, J.-S. Chen, K. Fu, P.-F. Hsu
Proc. ASME. IMECE2008, Volume 10: Heat Transfer, Fluid Flows, and Thermal Systems, Parts A, B, and C, 1991-2000, October 31–November 6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2008-69256
https://doi.org/10.1115/IMECE2008-69256
View Paper titled, Impact of Nanoscale Features of Metallic Slits on Mid-Infrared Radiative Properties
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Topics: Nanoscale phenomena
Proceedings Papers

Indirect Measurements of Coherent Thermal Emission From a Truncated Photonic Crystal Structure

B. J. Lee, Y. -B. Chen, Z. M. Zhang
Proc. ASME. HT2007, ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference, Volume 3, 413-419, July 8–12, 2007
Publisher: American Society of Mechanical Engineers
Paper No: HT2007-32303
https://doi.org/10.1115/HT2007-32303
View Paper titled, Indirect Measurements of Coherent Thermal Emission From a Truncated Photonic Crystal Structure
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Topics: Crystal structure, Crystals, Emissions, Surface waves (Fluid)
Proceedings Papers

Mid-Infrared Properties of Nanoscale Metallic Slit Arrays

Y.-B. Chen, K. Fu, C.-H. Chen, P.-F. Hsu, Y.-C. Lee
Proc. ASME. HT2008, Heat Transfer: Volume 3, 709-712, August 10–14, 2008
Publisher: American Society of Mechanical Engineers
Paper No: HT2008-56197
https://doi.org/10.1115/HT2008-56197
View Paper titled, Mid-Infrared Properties of Nanoscale Metallic Slit Arrays
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Topics: Cavities, Dielectric materials, Diffraction gratings, Energy conversion, Metals, Microscopy, Nanolithography, Nanoscale phenomena, Optical instruments, Periodic structures
Proceedings Papers

Design of Wavelength-Selective Surfaces for Mid-Infrared Detectors Using Heavily Doped Silicon Complex Gratings

Y.-B. Chen, Z. M. Zhang
Proc. ASME. MNHT2008, ASME 2008 First International Conference on Micro/Nanoscale Heat Transfer, Parts A and B, 1211-1218, June 6–9, 2008
Publisher: American Society of Mechanical Engineers
Paper No: MNHT2008-52005
https://doi.org/10.1115/MNHT2008-52005
View Paper titled, Design of Wavelength-Selective Surfaces for Mid-Infrared Detectors Using Heavily Doped Silicon Complex Gratings
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Topics: Design, Diffraction gratings, Plasmons (Physics), Polaritons, Sensors, Silicon, Wavelength
Proceedings Papers

Infrared Radiative Properties of Submicron Metallic Slit Arrays

Y.-B. Chen, B. J. Lee, Z. M. Zhang
Proc. ASME. IMECE2007, Volume 8: Heat Transfer, Fluid Flows, and Thermal Systems, Parts A and B, 1255-1264, November 11–15, 2007
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2007-41268
https://doi.org/10.1115/IMECE2007-41268
View Paper titled, Infrared Radiative Properties of Submicron Metallic Slit Arrays
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Topics: Diffraction gratings, Fourier transforms, Geometry, Microscale devices, Modeling, Nanoscale phenomena, Nanostructures , Reflectance, Silicon, Wavelength
Journal Articles

Infrared Radiative Properties of Submicron Metallic Slit Arrays

Y.-B. Chen, B. J. Lee, Z. M. Zhang
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2008, 130(8): 082404.
https://doi.org/10.1115/1.2909614
Published Online: June 4, 2008
View Article titled, Infrared Radiative Properties of Submicron Metallic Slit Arrays
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Topics: Diffraction gratings, Reflectance, Wavelength, Waves, Absorption, Geometry, Spectra (Spectroscopy), Modeling, Nanostructures , Radiation (Physics)
Proceedings Papers

Radiative Properties of Pattered Wafers With Linewidth Below 100 nm

Y.-B. Chen, Z. M. Zhang, P. J. Timans
Proc. ASME. IMECE2005, Heat Transfer, Part B, 793-804, November 5–11, 2005
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2005-82418
https://doi.org/10.1115/IMECE2005-82418
View Paper titled, Radiative Properties of Pattered Wafers With Linewidth Below 100 nm
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Topics: Semiconductor wafers, Spectral linewidth, Waves
Journal Articles

Radiative Properties of Patterned Wafers With Nanoscale Linewidth

Y.-B. Chen, Z. M. Zhang, P. J. Timans
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. January 2007, 129(1): 79–90.
https://doi.org/10.1115/1.2401201
Published Online: June 8, 2006
View Article titled, Radiative Properties of Patterned Wafers With Nanoscale Linewidth
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Topics: Diffraction gratings, Nanoscale phenomena, Radiation (Physics), Semiconductor wafers, Temperature, Wavelength, Waves, Diffraction, Polarization (Electricity), Polarization (Light)
Journal Articles

Diagnosis of the Tapping Process by Information Measure and Probability Voting Approach

Y. B. Chen, J. L. Sha, S. M. Wu
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Research Papers
J. Manuf. Sci. Eng. November 1990, 112(4): 319–325.
https://doi.org/10.1115/1.2899594
Published Online: November 1, 1990
View Article titled, Diagnosis of the Tapping Process by Information Measure and Probability Voting Approach
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Topics: Probability, Algorithms, Cutting, Reliability, Statistical analysis, Uncertainty