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Technical Papers

J. Eng. Mater. Technol. April 2000, 122(2): 149–156. doi: https://doi.org/10.1115/1.482780
J. Eng. Mater. Technol. April 2000, 122(2): 157–161. doi: https://doi.org/10.1115/1.482781
J. Eng. Mater. Technol. April 2000, 122(2): 162–167. doi: https://doi.org/10.1115/1.482782
J. Eng. Mater. Technol. April 2000, 122(2): 168–176. doi: https://doi.org/10.1115/1.482783
J. Eng. Mater. Technol. April 2000, 122(2): 177–185. doi: https://doi.org/10.1115/1.482784
J. Eng. Mater. Technol. April 2000, 122(2): 186–191. doi: https://doi.org/10.1115/1.482785
J. Eng. Mater. Technol. April 2000, 122(2): 192–197. doi: https://doi.org/10.1115/1.482786
J. Eng. Mater. Technol. April 2000, 122(2): 198–202. doi: https://doi.org/10.1115/1.482787
J. Eng. Mater. Technol. April 2000, 122(2): 203–208. doi: https://doi.org/10.1115/1.482788
J. Eng. Mater. Technol. April 2000, 122(2): 209–214. doi: https://doi.org/10.1115/1.482789
J. Eng. Mater. Technol. April 2000, 122(2): 215–220. doi: https://doi.org/10.1115/1.482790
J. Eng. Mater. Technol. April 2000, 122(2): 221–228. doi: https://doi.org/10.1115/1.482791
J. Eng. Mater. Technol. April 2000, 122(2): 229–237. doi: https://doi.org/10.1115/1.482792
J. Eng. Mater. Technol. April 2000, 122(2): 238–244. doi: https://doi.org/10.1115/1.482793
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