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Keywords: simulative measuring model
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Journal Articles
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030910.
Published Online: May 28, 2010
...Zone-Ching Lin; Ming-Ho Chou This study constructs a novel scanning near-field optical microscope (SNOM) fixed-amplitude simulative measuring model. It uses Al, Si, and O atoms to compose the probe tip and sample to construct the atomic model of SNOM simulative measuring model. It also applies...
