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Keywords: near-field scanning optical microscopy
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Journal Articles

Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

Zone-Ching Lin, Ming-Ho Chou
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030910.
https://doi.org/10.1115/1.4001685
Published Online: May 28, 2010
... 05 2010 28 05 2010 Morse potential near-field scanning optical microscopy optical microscopes vibrations scanning near-field optical microscopy Morse potential fixed-amplitude edge effect simulative measuring model In 1984, IBM Zurich Laboratory developed the first...
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Topics: Near-field scanning optical microscopy, Optical fiber, Probes, Nanoscale phenomena, Optical microscopes, Atoms, Atomic interactions, Vibration