The response of materials after microscale laser shock peening (μLSP) was experimentally characterized and compared with the theoretical prediction from FEM analysis in microlength level. Since μLSP is predominantly a mechanical process instead of a thermal process, the characterization focuses on mechanical properties and associated microstructures. An X-ray microdiffraction technique was applied on the postpeened single crystal aluminum of (001) and (110) orientations, and an X-ray profile was analyzed by subprofiling and Fourier analysis method. Spatially resolved residual stress and strain deviation was quantified and explained in terms of the heterogeneous dislocation cell structure. In-plane crystal lattice rotation induced by μLSP were measured by electron backscatter diffraction (EBSD) and compared with the FEM simulation. Average mosaic size was evaluated from X-ray profile Fourier analysis and compared with the result from EBSD. Surface strength increase and dislocation cell structure formation were studied. The systematical characterization helps develop more realistic simulation models and obtain better understanding in microlength level.
Issue Section:
Technical Papers
Keywords:
aluminium,
laser materials processing,
surface treatment,
internal stresses,
crystal orientation,
surface structure,
laser beam effects,
mosaic structure,
Fourier analysis,
X-ray diffraction,
Laser Shock Peening,
Single Crystal Aluminum,
X-ray Microdiffraction,
Residual Stress
Topics:
Aluminum,
Crystals,
Dislocations,
Electron backscatter diffraction,
Finite element methods,
Finite element model,
Laser hardening,
Microscale devices,
Rotation,
Shock (Mechanics),
Simulation,
Stress,
X-ray diffraction,
X-rays,
Shot peening,
Fourier analysis,
Deformation,
Crystal lattices,
Lasers
1.
Walraven
, J. A.
, Mani
, S. S.
, Fleming
, J. G.
, Headley
, T. J.
, Kotula
, P. G.
, Pimentel
, A. A.
, Rye
, M. J.
, Tanner
, D. M.
, and Smith
, N. F.
, 2000
, “Failure Analysis of Tungsten Coated Polysilicon Micromachined Microengines,” MEMS Reliability for Critical Applications
, Proc. SPIE
, 4180
, pp. 49
–57
.2.
Frederick
, Kevin M.
, and Fedder
, Gary K.
, 2000
, “Mechanical Effects of Fatigue and Charge on CMOS MEMS,” MEMS Reliability for Critical Applications
, Proc. SPIE
, 4180
, pp. 108
–116
.3.
Zhang, W., and Yao, Y. L., 2001, “Feasibility Study of Inducing Desirable Residual Stress Distribution in Laser Micromachining,” Trans. North American Manufacturing Research Institution of SME (NAMRC XXIX) 2001, SME, pp. 413–420.
4.
Zhang, W., and Yao, Y. L., 2000, “Improvement of Laser Induced Residual Stress Distributions via Shock Waves,” Proc. ICALEO’00, Laser Materials Processing, Detroit, MI, Vol. 89, pp. E183–192.
5.
Zhang
, W.
, and Yao
, Y. L.
, 2000
, “Micro Scale Laser Shock Processing of Metallic Components
,” ASME J. Manuf. Sci. Eng.
, 124
(2
), pp. 369
–378
.6.
Chen, H. Q., and Yao, Y. L., 2003, “Modeling Schemes, Transiency, and Strain Measurement for Microscale Laser Shock Processing,” Trans. of The North American Manufacturing Research Institution of SME, NAMRC 31, Hamilton, Canada, SME, May, pp. 589–596.
7.
Noyan
, I. C.
, Jordan-Sweet
, J. L.
, Liniger
, E. G.
, and Kaldor
, S. K.
, 1998
, “Characterization of Substrate/Thin-Film Interfaces With X-ray Microdiffraction
,” Appl. Phys. Lett.
, 72
(25
), pp. 3338
–3340
.8.
Noyan
, I. C.
, Wang
, P.-C
, Kaldor
, S. K.
, and Jordan-Sweet
, J. L.
, 1999
, “Deformation Field in Single-Crystal Semiconductor Substrates Caused by Metallization Features
,” Appl. Phys. Lett.
, 74
(16
), pp. 2352
–2354
.9.
Hutchinson
, J. W.
, 2000
, “Plasticity at the Micron Scale
,” Int. J. Solids Struct.
, 37
, pp. 225
–238
.10.
Clauer, A. H., and Fairland, B. P., 1979, “
Interaction of Laser-Induced Stress Waves With Metals,” Applications of Lasers in Materials Processing (Ed., E. Metzbower), ASM International, Materials Park, OH, p. 229.
11.
Nalla
, R. K.
, Altenberger
, I.
, Noster
, U.
, Liu
, G. Y.
, Scholtes
, B.
, and Ritchie
, R. O.
, 2003
, “On the Influence of Mechanical Surface Treatments Deep Rolling and Laser Shock Peening on the Fatigue Behavior of Ti-6Al-/4V at Ambient and Elevated Temperatures
,” Mater. Sci. Eng., A
, 355
, pp. 216
–230
.12.
Fabbro
, R.
, Fournier
, J.
, Ballard
, P.
, Devaux
, D.
, and Virmont
, J.
, 1990
, “Physical Study of Laser-Produced Plasma in Confined Geometry
,” J. Appl. Phys.
, 68
(2
), pp. 775
–784
.13.
Asaro
, R. J.
, 1983
, “Micromechanics of Crystals and Polycrystals
,” Adv. Appl. Mech.
, 23
, pp. 1
–115
.14.
Huang, Y., 1991, “A User-Material Subroutine Incorporating Single Crystal Plasticity in the ABAQUS Finite Element Program,” Mech Report 178,” Divi. of Applied Sciences, Harvard Univ., Cambridge, MA.
15.
Kysar, J. W., 1997, Addendum to “A User-Material Subroutine Incorporating Single Crystal Plasticity in the ABAQUS Finite Element Program,” Mech Report 178,” Divi. of Engineering and Applied Sciences, Harvard Univ., Cambridge, MA.
16.
ABAQUS/Standard User’s Manual, 2002, Version 6.2, Hibbit, Karlsson, and Sorensen, Inc., Pawtucket, RI.
17.
Rice
, J. R.
, 1987
, “Tensile Crack Tip Fields in Elastic-Ideally Plastic Crystals
,” Mech. Mater.
, 6
(4
), pp. 317
–335
.18.
Cullity, B. D., 1978, Elements of X-Ray Diffraction, Second Edition, Addison-Wesley, Reading, MA, London, pp. 268–270.
19.
Noyan
, I. C.
, Wang
, P.-C
, Kaldor
, S. K.
, and Jordan-Sweet
, J. L.
, 2000
, “Divergence Effects in Monochromatic X-Ray Microdiffraction Using Tapered Capillary Optics
,” Rev. Sci. Instrum.
, 71
(5
), pp. 1991
–2000
.20.
SPEC™ X-Ray Diffraction Software, Certified Scientific Software, Cambridge, MA.
21.
HKL Channel 5™ User’s Manual, 2001, HKL Technology, Danbury, CT.
22.
Chen, H. Q., Kysar, J. W., and Yao, Y. L., 2003, “Characterization of Plastic Deformation Induced by Micro Scale Laser Shock Peening,” ASME J. Appl. Mech., (submitted).
23.
Ungar
, T.
, Ribarik
, G.
, Gubicza
, J.
, and Hanak
, P.
, 1984
, “X-Ray Line-Broadening Study of the Dislocation Cell Structure in Deformed [001]-Orientated Copper Single Crystals
,” Acta Metall.
, 32
(3
), pp. 333
–342
.24.
Warren
, B. E.
, and Averbach
, B. L.
, 1950
, “The Effect of Cold-Work Distortion on X-Ray Patterns
,” J. Appl. Phys.
, 21
, pp. 595
–599
.25.
Chen, H. Q., Yao, Y. L., and Kysar, J. W., 2003, “Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening,” Proc. of 22nd Int. Congress on Applications of Lasers & Electro-Optics (ICALEO), Conf. on Laser Materials Processing, Section B, Jacksonville, FL, October, pp. 1–10.
26.
Warren, B. E., 1969, X-Ray Diffraction, Addison-Wesley, Reading, MA, Chap. 13.
27.
Noyan, I. C., and Cohen, J. B., 1987, Residual Stress-Measurement by Diffraction and Interpretation, Springer-Verlag Inc., New York, pp. 168–175.
28.
Chen, H. Q., Yao, Y. L., Kysar, J. W., Noyan, I. C., and Wang, Y. N., 2003, “Fourier Analysis of X-Ray Microdiffraction Profiles to Characterize Laser Shock Peened Metals,” Trans. of North American Manufacturing Research Institution of SME, NAMRC 32, Charlotte, NC, June, SME.
29.
Mandel
, J.
, 1982
, “Definition of a Frame Suitable to the Study of Anelastic Transformations of Polycrystal
,” J. Mec. Theor. Appl.
, 1
(1
), pp. 7
–23
.30.
Meyers, M. A., Armstrong, R. W., and Kirchner, H., 1999, Mechanics and Materials: Fundamentals and Linkages, Wiley, New York, pp. 377–381.
31.
Murr, L. E., 1981, “Microstructure-Mechanical Property Relations,” Shock-Wave and High-Strain-Rate Phenomena in Metals, Plenum Press, New York, pp. 607–671.
32.
Hansen
, N.
, and Kuhlmann-Wilsdorf
, D.
, 1986
, “Proceedings of the International Conference on Low-Energy Dislocation Structures
,” Mater. Sci. Eng.
, 81
, pp. 141
–152
.33.
Kratochvil
, J.
, 1990
, “Instability Origin of Dislocation Cell Misorientation
,” Scr. Mater.
, 24
(7
), pp. 1225
–1228
.34.
Hahner
, P.
, 1996
, “A Theory of Dislocation Cell Formation Based on Stochastic Dislocation Dynamics
,” Acta Mater.
, 44
(6
), pp. 2345
–2352
.35.
Stouffer, D. C., and Dame, L. T., 1996, Inelastic Deformation of Metals, Wiley, New York, pp. 12–15.
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