1-2 of 2
Keywords: Auger electron spectroscopy
Sort by
Journal Articles
Publisher: ASME
Article Type: Micro/Nanoscale Heat Transfer—Part Ii
J. Heat Mass Transfer. April 2009, 131(4): 043207.
Published Online: February 20, 2009
... conductance are presented. To examine the effects of atomic mixing at the interface on h B D , a series of Cr/Si samples was fabricated subject to different deposition conditions. The varying degrees of atomic mixing were measured with Auger electron spectroscopy. Phonon scattering phenomena in the presence...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. June 2008, 130(6): 062402.
Published Online: April 23, 2008
... deposition conditions to control the growth around the Cr ∕ Si boundary. The Cr ∕ Si interfaces are characterized with Auger electron spectroscopy. The thermal boundary conductance ( h BD ) is measured with the transient thermoreflectance technique. Values of h BD are found to vary with both the thickness...