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Keywords: elemental semiconductors
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Journal Articles
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2006, 73(5): 745–751.
Published Online: January 18, 2006
... ratios of biaxial stress in a simple and compact test geometry. This fixture was used under a microscope, enabling in situ measurement of biaxial stress states. 16 12 2004 18 01 2006 silicon elemental semiconductors Raman spectra stress effects There exist a large number...
Topics: Silicon, Stress
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2006, 73(5): 714–722.
Published Online: December 10, 2005
... actuated microdevices and the effective fracture toughness was derived by a finite element (FE) analysis that required precise fabrication of interdigitated comb finger arrays. silicon elemental semiconductors semiconductor devices micromechanical devices reliability crack-edge stress field...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. November 2005, 72(6): 932–935.
Published Online: October 5, 2005
... and atomic displacement distributions for an atomically sharp crack in Cu, where one observes the emission of a partial dislocation loop, and in Si, where crack front extension evolves in a kink-like fashion. 05 10 2004 05 10 2005 copper silicon elemental semiconductors cracks ductility...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2004, 71(5): 672–676.
Published Online: November 9, 2004
..., Santa Barbara, CA 93106-5070, and will be accepted until four months after final publication in the paper itself in the ASME JOURNAL OF APPLIED MECHANICS . 28 August 2003 15 April 2004 09 11 2004 germanium silicon elemental semiconductors semiconductor quantum dots...
Journal Articles
Publisher: ASME
Article Type: Article
J. Appl. Mech. May 2005, 72(3): 400–407.
Published Online: October 6, 2004
... of nanostructures. 27 10 2003 06 10 2004 silicon elemental semiconductors vacancies (crystal) semiconductor thin films internal stresses elasticity stress effects impurity-vacancy interactions Surface processes such as material deposition onto a substrate, surface...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. July 2002, 69(4): 451–453.
Published Online: June 20, 2002
... candidates for building blocks of molecule-scale machines and nanoelectronic devices ( 3 4 5 6 ). Carbon nanotubes can behave either as semiconductors or metals depending on atomic arrangement determined by chirality’s vector ( 7 ). carbon nanotubes density functional theory elemental...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. March 2001, 68(2): 298–303.
Published Online: October 19, 2000
... deformation stress analysis silicon elemental semiconductors curvature measurement Many engineering applications employ initially curved shells which are coated by thin, generally inhomogeneous and anisotropic layers. Most common examples include thermal-barrier or wear-resistant coatings...