1-6 of 6
Focused ion beams
Close
Save search
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Additive Manufacturing of Metals at Micro/Nanoscale by Localized Pulsed Electrodeposition: Nanotwinned Copper Nanowires

Soheil Daryadel, Ali Behroozfar, S. Reza Morsali, Rodrigo A. Bernal, Majid Minary
Proc. ASME. MSEC2018, Volume 1: Additive Manufacturing; Bio and Sustainable Manufacturing, V001T01A027, June 18–22, 2018
Paper No: MSEC2018-6552
DOI: https://doi.org/10.1115/MSEC2018-6552
View Paper
PDF
Topics: Additive manufacturing, Copper, Electrodeposition, Metals, Nanoscale phenomena, Nanowires, Printing, Wire, Compression, Electrical properties
Proceedings Papers

A Discussion on Removal Mechanisms in Grinding Polycrystalline Diamond

Florestan Schindler, Fritz Klocke, Richard Brocker, Patrick Mattfeld
Proc. ASME. MSEC2014, Volume 2: Processing, V002T02A014, June 9–13, 2014
Paper No: MSEC2014-4102
DOI: https://doi.org/10.1115/MSEC2014-4102
View Paper
PDF
Topics: Diamonds, Grinding, Stress, Brittleness, Diamond turning, Focused ion beams, Grinding equipment, Grinding wheels, Polishing, Simulation
Proceedings Papers

Sub-Surface Crack Analysis for Diamond Slurry Lapping of Sapphire Wafers

Chao-Chang A. Chen, Wei-Kang Tu, Jyun-Kai Yang
Proc. ASME. MSEC2014, Volume 2: Processing, V002T02A010, June 9–13, 2014
Paper No: MSEC2014-3995
DOI: https://doi.org/10.1115/MSEC2014-3995
View Paper
PDF
Topics: Diamonds, Fracture (Materials), Grinding, Sapphire, Semiconductor wafers, Slurries, Temperature, Viscosity, Instrumentation, Polishing
Proceedings Papers

A Preliminary Study on Machinability of Polymethylmethacrylate (PMMA)/Multi-Walled Carbon Nanotube (MWCNT) Nanocomposites in Focused Ion Beam Micromachining

Pengfei Li, Wei Xue, Dave Dae-Wook Kim, Young-Bin Park
Proc. ASME. MSEC2011, ASME 2011 International Manufacturing Science and Engineering Conference, Volume 2, 515-523, June 13–17, 2011
Paper No: MSEC2011-50115
DOI: https://doi.org/10.1115/MSEC2011-50115
View Paper
PDF
Topics: Focused ion beams, Machinability, Micromachining, Multi-walled carbon nanotubes, Nanocomposites, Microscale devices, Plasma desorption mass spectrometry, Casting, Lithography, Scanning electron microscopes
Proceedings Papers

Modeling and Simulation of Focused Ion Beam Based Single Digital Nano Hole Fabrication for DNA and Macromolecule Characterization

Jack Zhou, Guoliang Yang
Proc. ASME. MSEC2008, ASME 2008 International Manufacturing Science and Engineering Conference, Volume 2, 431-440, October 7–10, 2008
Paper No: MSEC_ICM&P2008-72033
DOI: https://doi.org/10.1115/MSEC_ICMP2008-72033
View Paper
PDF
Topics: DNA, Focused ion beams, Macromolecules, Manufacturing, Modeling, Simulation, Thin films, Atomic force microscopy, Cathode ray oscilloscopes, Electron beams
Proceedings Papers

Molding of Three-Dimensional Microcomponents

W. N. P. Hung, M. M. Agnihotri, M. Y. Ali, S. Yuan
Proc. ASME. MSEC2006, Manufacturing Science and Engineering, Parts A and B, 1043-1050, October 8–11, 2006
Paper No: MSEC2006-21123
DOI: https://doi.org/10.1115/MSEC2006-21123
View Paper
PDF
Topics: Molding, Polymers, Cavities, Microelectromechanical systems, Micromachining, Stress, Aluminum, Biocompatibility, Composite materials, Deformation