0
TECHNICAL PAPERS

A Three Degree-of-Freedom Model for Self-Retracting Fully Compliant Bistable Micromechanisms

[+] Author and Article Information
Nathan D. Masters

Georgia Institute of Technology, 326714 Georgia Tech Station, Atlanta, GA 30332-1125

Larry L. Howell

Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602

J. Mech. Des 127(4), 739-744 (Jun 27, 2005) (6 pages) doi:10.1115/1.1828463 History: Received February 10, 2004; Revised April 27, 2004; Online June 27, 2005
Copyright © 2005 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Scanning electron micrograph (SEM) of SRFBM system: (a) SRFBM; (b) and (c) forward and return thermomechanical in-plane microactuators (TIM), respectively; (d) electrical switching contacts; and (e) electrical bond pads for resistive thermal self-retraction
Grahic Jump Location
SRFBM (a) single degree-of-freedom double-slider model overlayed with SRFBM geometry, and (b) three degree-of-freedom pseudo-rigid-body model
Grahic Jump Location
Vector loop diagram superposed on the PRBM. The vector z̄3 is offset for clarity.
Grahic Jump Location
Comparison of SRFBM models: (a) force-deflection and (b) potential energy. Equilibria are identified in the potential energy curves as minima (stable) and maxima (unstable) and correspond to the zeros of the force-deflection curves. The MCF (measured critical force) is depicted as a horizontal line.
Grahic Jump Location
SEM images showing force tester and SRFBM in the second stable equilibrium position

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In